High spatial frequencies in the illuminating light of microscopes lead to a shift of the object spatial frequencies detectable through the objective lens. If a suitable procedure is found for evaluation of the measured data, a microscopic image with a higher resolution than under flat illumination can be obtained. A simple method for generation of a laterally modulated illumination pattern is discussed here. A specially constructed diffraction grating was inserted in the illumination beam path at the conjugate object plane (position of the adjustable aperture) and projected through the objective into the object. Microscopic beads were imaged with this method and evaluated with an algorithm based on the structure of the Fourier space. The results indicate an improvement of resolution.

<title>Laterally modulated excitation microscopy: improvement of resolution by using a diffraction grating</title>

Scan to connect with one of our mobile apps

Coinbase Wallet app

Coinbase app

Or try the Coinbase Wallet browser extension

&lt;title&gt;Laterally modulated excitation microscopy: improvement of resolution by using a diffraction grating&lt;/title&gt;

Scan to connect with one of our mobile apps

Coinbase Wallet app

Coinbase app

Or try the Coinbase Wallet browser extension

<title>Laterally modulated excitation microscopy: improvement of resolution by using a diffraction grating</title>